Info Center - Resources

Note: Lumetrics has moved since some of our original documentation has been created, thus reflecting our previous address. Our new address is: Eagle's Landing Business Park, 1565 Jefferson Road, #420, Rochester, NY 14623.

Solution Development

• Lumetrics 360 Assessment Process - Technology Feasibility vs. Business Suitability
  
  "If I had one hour to save the world, I would spend fifty-five minutes defining the problem, and only five minutes finding the solution."
  –Albert Einstein
  
  Most companies do not have a structured process to evaluate innovative inspection opportunities and there is no timeline or criteria to form a yes or no decision. As a result, opportunities are missed and competitive advantage is lost. Lumetrics, as an experienced external mediator, takes you through their proven and repeatable step-by-step process to ensure your business objectives are defined and there is a clear return on investment from the product/service purchased in terms of the five industry recognized standards for business performance improvement.
  


• Lumetrics Sample Testing Form

Marketing Presentations

• LumetriScan™ Innovation Briefs Presentation, John Hart, MDM East 2011 (June, 2011)
• Non-Contact Measurement and Analysis of Six Micron+ Thin Wall Coatings on Medical Balloons and Catheters Using Low Coherence Interferometry, (July, 2008)
• Lumetrics OptiGauge Presentation

Product Information

• OptiGauge Brochure
• OptiGauge SLS™ Data Sheet
• OptiGauge MLS™ Data Sheet
• OptiGauge EMS™ Data Sheet
• Lumetrics Glass Applications
• Adhesive Coating Thickness Measurement Summary
• LumetriScan™ Information Sheet
• Tubing Monitor 360
• RoLSS Description
• Automated X/Y Tissue Scanning System
• Extended Support Agreement
• Sample Measurement Testing - Medical Balloons

Technical Papers

• Why New Inspection Methods Can Cost Less - MDTmag.com - November/December 2012, authored by Steve Heveron-Smith, Lumetrics®
• Measuring Food Packaging Materials - Low-coherence interferometry measures the inside layer on a continuous production line. (Photonics Spectra Magazine, 2008)
• Patent Reform To Benefit IVD Industry - IVD Technology (April 13, 2011)
• Non-Contact Measurement and Analysis of Six Micron+ Thin Wall Coatings on Medical Balloons and Catheters Using Low Coherence Interferometry), (July, 2008
• See how the OptiGauge is being used to measure piezo injectors
• Laser Hazard Analysis
• "Measurement of Multi-Layer Structures Using Non-Contact Reflective Light Technology", presented at SPIE Polyolefins Conference, (March, 2006)
• "Non-Contact Measurement of Absolute Dimensions", presented at the Summer 2005 SPIE conference
• "Uncertainty Evaluation Of a Fiber-Based Interferometer For the Measurement of Absolute Dimensions"), (July, 2005)
• "SPIE Optics East - October, 2004 "; Practical Applications in Film and Optics Measurements for Dual Light Source Interferometry
• "TAPPI Place - September, 2004"; Multi-Layer Film Measurement Using Dual-Light Interferometry
• "Flip Chip Topical Workshop - June, 2004"; Jetting Dispensing of Fluxes for Flip Chip Attachment and Measurement Methods for Ensuring Consistent Flux Coatings
• "Fiber optic instrumentation for industrial process monitoring and control applications", Authored by Michael A. Marcus, Eastman Kodak Company, Proceedings SPIE, vol. 4578, pgs. 136-144, published 2002